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Surface Science & Analytics - Prof. (apl.) Dr. Michael Zharnikov

FACILITIES

  • Multifunctional UHV system (LHS): XPS, UPS, ISS, TPD, Kelvin Probe, PEEM, LEED, sample handling tools, and load-lock chamber
  • Multifunctional UHV system (Max 200): XPS, electron irradiation, sample handling
  • Endstation for XPS/NEXAFS at the HESGM beamline (BESSY II, Berlin), maintained by a community (CRG) of several groups
  • Molecular junction setup for the measurements of conductive properties of molecular films and SURMOFs
  • LEO 1530 Secondary electron microscope (Zeiss) with a Raith Elphy Plus pattern generator system - shared with other groups at the Physical-Chemical Institute.
  • Mask-free lithographic setup, based on commercial components and including a high power UV LED (375 nm) as the light source, a digital micro-mirror device (DMD) chip, and projection optics. This equipment is shared with a partner group
  • AFM device Solver Next (NT-MDT) – shared with a partner group;
  • Vertex 70 Fourier transform IR spectrometer (Bruker) – shared with a partner group;
  • M-44 ellipsometer (J.A. Woollam Co. Inc.) - shared with a partner group;
  • UV-Vis spectrophotometer Jasco V-650 (transmission and reflection units)
  • Electrochemistry setup
  • Krüss goniometer Model G1 - shared with a partner group;
  • Chemistry lab
Responsible E-Mail Latest Revision: 11.01.2016
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